• Increase test rate to 100 MHz
• Input or output data
• Software selectable termination
• For use with GT5150 or GT5900

Description

The GT5920 100MHz frequency multiplier module increases the upper test rate limit to 100 MHz. The increase in test rate is achieved by interleaving a single I/O pin into two parallel memory locationss. The GT5920 provides 16 Input or Output pins (in groups of 8 pins). The GT5920 is a GT5150 and GT5900 plug-in unit.

Architecture

The GT5920 frequency multiplier module converts the 32, 50 MHz I/O channels into 16, 100 MHz I/O channels. The memory MUX/interleave logic is designed into a single high-speed programmable logic device, thereby minimizing propagation delays. Concurrent high and low word memory locationss are interleaved using opposite phases of the programmable output clock. Each I/O pin has a corresponding termination that can be globally enabled or disabled through software control.

Programming

The GT5920 Module is controlled via the host GT5150 or GT5900. Programmable functions include:

• Signal termination enable/disable
• I/O data direction
• Tri-state control

Applications

• Up to 100 MHz test rate applications
• Hard drive testing
• IC testing
• Bus emulation